Industrial analysis: Metals, chemicals and advanced materials

Journal of Analytical Atomic Spectrometry

Volumn 15, Issue 12, 2000, Pages 1606-1631

  Fairman, Ben ^a   Hinds, Michael W ^b   Nelms, Simon M ^c   Penny, Denise M ^d   Goodall, Phill ^e  

^a LGC   (United Kingdom)

^b Royal Canadian Mint   (Canada)

^c JOINT RESEARCH CENTRE   (Italy)

^d SHELL RESEARCH AND TECHNOLOGY CENTRE   (Netherlands)

^e SELLAFIELD LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000440743     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b007460h     Document Type: Review

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