Critical behavior of frustrated systems: Monte Carlo simulations versus renormalization group

JETP Letters

Volumn 72, Issue 6, 2000, Pages 337-340

  Loison, D ^a   Sokolov, A I ^b   Delamotte, B ^c   Antonenko, S A ^b   Schotte, K D ^a   Diep, H T ^d  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

^c UNIVERSITÉ PARIS DESCARTES   (France)

^d UNIVERSITÉ DE CERGY PONTOISE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000439297     PISSN: 00213640     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1328451     Document Type: Article

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