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Physical Review B

Volumn 13, Issue 6, 1976, Pages 2653-2666

EPR studies of defects in electron-irradiated silicon: A triplet state of vacancy-oxygen complexes

(2) Lee, Young Hoon a Corbett, James W a

a STATE UNIVERSITY OF NEW YORK (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000437604 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.13.2653 Document Type: Article

Times cited : (238)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.