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Volumn 8, Issue 9, 1996, Pages 2391-2398

Aluminophosphate chain-to-layer transformation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000433391     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm960216t     Document Type: Article
Times cited : (154)

References (24)
  • 2
    • 0043134700 scopus 로고    scopus 로고
    • U. S. Patent 4, 310,440
    • Wilson, S. T.; Lok, B. M.; Messina, C. A.; Cannan, T. R.; Flanigen, E. M. J. Am. Chem. Soc. 1982, 104, 1146. Wilson, S. T.; Lok, B. M.; Flanigen, E. M. U. S. Patent 4, 310,440.
    • Wilson, S.T.1    Lok, B.M.2    Flanigen, E.M.3
  • 13
    • 0001179352 scopus 로고
    • von Ballmoos, R., Higgins, J. B.; Treacy, M. M. J., Eds.; Butterworth-Heinemann: Toronto
    • Xu, R.; Huo, Q.; Pang, W. In Proceedings from the Ninth International Zeolite Conference; von Ballmoos, R., Higgins, J. B.; Treacy, M. M. J., Eds.; Butterworth-Heinemann: Toronto, 1993; Vol. 1, p 271.
    • (1993) Proceedings from the Ninth International Zeolite Conference , vol.1 , pp. 271
    • Xu, R.1    Huo, Q.2    Pang, W.3
  • 18
    • 85022382653 scopus 로고    scopus 로고
    • Program for Absorption Correction, University of Göttingen, Germany
    • Sheldrick, G. M. SHELXA-90, Program for Absorption Correction, University of Göttingen, Germany.
    • SHELXA-90
    • Sheldrick, G.M.1
  • 19
    • 84871244097 scopus 로고    scopus 로고
    • Siemens Analytical X-Ray Instruments Inc., Madison, WI
    • Sheldrick, G. M. SHELXTL/PC Version 5.0; (Siemens Analytical X-Ray Instruments Inc., Madison, WI)
    • SHELXTL/PC Version 5.0
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.