Ultrafast laser diagnostics and modeling for high-speed recording heads

IEEE Transactions on Magnetics

Volumn 35, Issue 2 PART 1, 1999, Pages 632-636

  Shi, Zhu Pei ^a   Hiebert, Wayne K ^b   Freeman, Mark R ^b  

^a WESTERN DIGITAL CORPORATION   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Flux rise times; High speed characterization; Magnetic recording heads; Ultrafast microscopy

Indexed keywords

EID: 0000433361     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.750619     Document Type: Article

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