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Volumn 7, Issue 5, 1997, Pages 733-736

Monitoring the growth of titanium oxide thin films by the liquid-phase deposition method with a quartz crystal microbalance

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[No Author keywords available]

Indexed keywords


EID: 0000431178     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a607466i     Document Type: Article
Times cited : (82)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.