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(Formula presented) for the Ag/Al samples was estimated from weak localization measurements on co-evaporated normal metal control wires. For the Au/Al samples, the control wires were destroyed before they could be measured, but measurements on other sample batches gave similar values. We believe (Formula presented) for the normal metal wires is very short due to the bake required for the second layer of the lithography.
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)] fit the temperature dependence of their Ag/Al Andreev interferometers using the Usadel equation in the linear approximation. In order to fit their data, they used a temperature dependent gap (Formula presented) but with a reduced zero temperature gap of one-fifth the experimentally estimated value (Formula presented)
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