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Volumn 41, Issue 5, 1998, Pages 735-738
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In situ measurement of interface supercooling during growth of Bi4Ge3O12 single crystals from melt
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000417382
PISSN: 00204412
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (14)
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References (9)
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