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Volumn 41, Issue 5, 1998, Pages 735-738

In situ measurement of interface supercooling during growth of Bi4Ge3O12 single crystals from melt

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EID: 0000417382     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.