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Volumn 80, Issue , 1996, Pages 147-150
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Multiple scattering study of synchrotron radiation photoelectron diffraction from Si(001)2×2-In surface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000413465
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/0368-2048(96)02943-X Document Type: Article |
Times cited : (8)
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References (10)
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