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Volumn 25, Issue 5, 1998, Pages 597-601

Atomic force microscopy of mechanically rubbed and optically buffed polyimide films

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Indexed keywords


EID: 0000407218     PISSN: 02678292     EISSN: 13665855     Source Type: Journal    
DOI: 10.1080/026782998205886     Document Type: Article
Times cited : (9)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.