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Microelectronic Engineering

Volumn 43-44, Issue , 1998, Pages 715-724

FIR optical study of CdS nanocrystals embedded in SiO2 films

(3) Vasilevskiy, M I a Rolo, A G b Gomes, M J M b

a LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD (Russian Federation)

b UNIVERSITY OF MINHO (Portugal)

Author keywords

Dielectric response; Fractals; Phonons; Raman scattering

Indexed keywords

EID: 0000399297 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-9317(98)00249-4 Document Type: Article

Times cited : (9)

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