High-speed fingerprint verification using an optical correlator

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3386, Issue , 1998, Pages 242-252

  Stoianov, Alex ^a   Soutar, Colin ^a   Graham, Al ^a  

^a Mytec Technologies Incorporated   (Canada)

Author keywords

False rejection acceptance rate; Field programmable gate array; Peak tracking; Projective decision boundaries

Indexed keywords

ACCEPTANCE TESTS; CCD CAMERAS; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); LOGIC GATES; OPTICAL DATA PROCESSING; REFRACTIVE INDEX;

CORRELATION DETECTION; DECISION BOUNDARY; FALSE ACCEPTANCE RATE; FALSE REJECTION; FALSE REJECTION RATE; FINGERPRINT VERIFICATION; OPTICAL CORRELATORS; TOTAL INTERNAL REFLECTIONS;

PATTERN RECOGNITION;

EID: 0000398112     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.304769     Document Type: Conference Paper

References (15)

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