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Volumn 35, Issue 12, 1996, Pages 3559-3567

Planar Solid-State and Solution Structures of (Porphinato)nickel(II) As Determined by X-ray Diffraction and Resonance Raman Spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000394552     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic960157l     Document Type: Article
Times cited : (104)

References (101)
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    • FAST is an acronym for fast-scanning area sensitive television detector. (b) ORTEP is an acronym for Oak Ridge thermal ellipsoid program
    • (a) FAST is an acronym for fast-scanning area sensitive television detector. (b) ORTEP is an acronym for Oak Ridge thermal ellipsoid program.
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    • The process is based on an adaption of the DIFABS logic (Walker, N. P. Acta Crystallogr., Sect. A 1983, 39, 158) to area detector geometry by Karaulov (Karaulov, A. I. Personal communication, School of Chemistry and Applied Chemistry, University of Wales, College of Cardiff, Cardiff CF1 3TB, U.K.).
    • (1983) Acta Crystallogr., Sect. A , vol.39 , pp. 158
    • Walker, N.P.1
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    • in press
    • Programs used in this study included SHELXL-93 (Sheldrick, G. M. J. Appl. Crystallogr., in press) and ORTEP (Johnson, C. K. ORTEP: A Fortran Thermal-Ellipsoid Plot Program For Crystal Structure Illustrations; Oak Ridge National Laboratory: Oak Ridge, TN, 1970). Scattering factors were taken from Wilson, A.J.C. International Tables of Crystallography; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1992; Vol. C.
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    • Programs used in this study included SHELXL-93 (Sheldrick, G. M. J. Appl. Crystallogr., in press) and ORTEP (Johnson, C. K. ORTEP: A Fortran Thermal-Ellipsoid Plot Program For Crystal Structure Illustrations; Oak Ridge National Laboratory: Oak Ridge, TN, 1970). Scattering factors were taken from Wilson, A.J.C. International Tables of Crystallography; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1992; Vol. C.
    • (1970) ORTEP: A Fortran Thermal-Ellipsoid Plot Program for Crystal Structure Illustrations
    • Johnson, C.K.1
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    • 0003872738 scopus 로고
    • Kluwer Academic Publishers: Dordrecht, The Netherlands
    • Programs used in this study included SHELXL-93 (Sheldrick, G. M. J. Appl. Crystallogr., in press) and ORTEP (Johnson, C. K. ORTEP: A Fortran Thermal-Ellipsoid Plot Program For Crystal Structure Illustrations; Oak Ridge National Laboratory: Oak Ridge, TN, 1970). Scattering factors were taken from Wilson, A.J.C. International Tables of Crystallography; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1992; Vol. C.
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    • (1967)
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    • 2 are based on the extinction coefficients of Cu(OEP) in dioxane taken from Somaya (Somaya, O. Ph.D. Thesis, University of Braunschweig, Germany, Dec 1967). Jentzen, W. Unpublished reseults.
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    • Unpublished reseults
    • 2 are based on the extinction coefficients of Cu(OEP) in dioxane taken from Somaya (Somaya, O. Ph.D. Thesis, University of Braunschweig, Germany, Dec 1967). Jentzen, W. Unpublished reseults.
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    • Unpublished results
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.