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Volumn 84, Issue 6, 1998, Pages 3254-3262

Grain size dependence of the current-voltage characteristics and critical current density in the self-field approximation

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Indexed keywords


EID: 0000382409     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368480     Document Type: Article
Times cited : (29)

References (102)
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    • note
    • c may be estimated by fitting Eq. (10) or Eq. (11) to the experimental I-V curves obtained at different temperatures for the fixed grain radius.


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