메뉴 건너뛰기




Volumn 55, Issue 24, 1997, Pages 16186-16197

Extended Si |P[311|P] defects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000374534     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.16186     Document Type: Article
Times cited : (83)

References (35)
  • 25
    • 0000282851 scopus 로고
    • by Ramstad et. al [Phys. Rev. B 51, 14 504 (1995)].
    • (1995) Phys. Rev. B , vol.51 , pp. 14504
  • 33
    • 0001415183 scopus 로고
    • M. Kohyama and S. Takeda, Phys. Rev. B 46, 12 305 (1992). The symbols for the structural units (I, O, and E) are adapted to describe the extended (311)\ defects.
    • (1992) Phys. Rev. B , vol.46 , pp. 12305
    • Kohyama, M.1    Takeda, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.