Magnetic properties of Cd1-xMnxTe and Zn1-xMnxTe epilayers with high concentration of Mn

Physica Status Solidi (A) Applied Research

Volumn 177, Issue 2, 2000, Pages 555-566

  Stachow Wojcik A ^a   Mac, W ^a   Twardowski, A ^a   Karczewski, G ^b   Janik, E ^b   Wojtowicz, T ^b   Kossut, J ^b   Dynowska, E ^b  

^a UNIVERSITY OF WARSAW   (Poland)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; COMPOSITION EFFECTS; EPITAXIAL GROWTH; FILM GROWTH; MAGNETIC FIELD EFFECTS; MAGNETIC PROPERTIES; MAGNETIZATION; REMANENCE; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; THERMAL EFFECTS;

CADMIUM MANGANESE TELLURIDE; DILUTED MAGNETIC SEMICONDUCTORS (DMS); MAGNETIC PHASE DIAGRAMS; SPIN-GLASS-ANTIFERROMAGNET TRANSITION; ZINC MANGANESE TELLURIDE;

SEMICONDUCTING FILMS;

EID: 0000374218     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(200002)177:2<555::AID-PSSA555>3.0.CO;2-F     Document Type: Article

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