Defect characterization of etch pits in ZnSe based epitaxial layers

Applied Physics Letters

Volumn 69, Issue 8, 1996, Pages 1089-1091

  U'Ren, G D ^a   Goorsky, M S ^a   Meis Haugen, G ^b   Law, K K ^b   Miller, T J ^b   Haberern, K W ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b 3M COMPANY   (United States)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000370251     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117067     Document Type: Article

References (13)

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