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Volumn 361, Issue 3, 1998, Pages 261-266
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Direct sampling time-of-flight mass spectrometers for technological analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000367180
PISSN: 09370633
EISSN: None
Source Type: Journal
DOI: 10.1007/s002160050876 Document Type: Article |
Times cited : (21)
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References (17)
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