Quantitative interfacial profiles in CdTe/Mn(Mg)Te heterostructures

Journal of Applied Physics

Volumn 84, Issue 2, 1998, Pages 756-764

  Charleux, M ^a   Rouviere J L ^a   Hartmann, J M ^a,b   Bourret, A ^a  

^a CEA GRENOBLE   (France)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000364515     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368134     Document Type: Article

References (31)

1. J. L. Pautrat, J. Phys. III 4, 2413 (1994).
2. J. M. Hartmann, G. Feuillet, M. Charleux, and H. Mariette, J. Appl. Phys. 79, 3035 (1996).
3. J. M. Hartmann, J. Cibert, F. Kany, H. Mariette, M. Charleux, P. Alleyson, R. Langer, and G. Feuillet, J. Appl. Phys. 80, 6257 (1996).
4. J. Bleuse, F. Kany, A. P. de Boer, P. C. M. Christianen, R. André, and H. Ulmer-Tuffigo, J. Cryst. Growth 184-185, 750 (1998).
5. R. André, D. Heger, L. S. Dang, and Y. M. d'Aubigné, Proceedings of the Eighth International Conference on II-VI Compounds, Grenoble, 1997 [J. Cryst. Growth 184-185, 758 (1998)].
6. R. André, D. Heger, L. S. Dang, and Y. M. d'Aubigné, Proceedings of the Eighth International Conference on II-VI Compounds, Grenoble, 1997 [J. Cryst. Growth 184-185, 758 (1998)].
7. A. Waag, G. Bacher, A. Jakobs, A. Forshel, and G. Landwher, J. Appl. Phys. 75, 5456 (1994).
8. W. Grieshaber, A. Haury, J. Cibert, Y. M. d'Aubigné, A. Wasiela, and J. A. Gaj, Phys. Rev. B 53, 4891 (1996).
9. W. Grieshaber, J. Cibert, J. A. Gaj, Y. M. d'Aubigné, and A. Wasiela, Phys. Rev. B 50, 2011 (1994).
10. F. Kany, J. M. Hartmann, H. Ulmer-Tuffigo, and H. Mariette, Proceedings of ICFSI-6, Cardiff, 1997 [Appl. Surf. Sci. 123-124, 710 (1998)].
11. F. Kany, J. M. Hartmann, H. Ulmer-Tuffigo, and H. Mariette, Proceedings of ICFSI-6, Cardiff, 1997 [Appl. Surf. Sci. 123-124, 710 (1998)].
12. J. M. Hartmann, M. Charleux, H. Mariette, and J. L. Rouvière, Appl. Surf. Sci. 112, 142 (1997).
13. R. Bierwolf, M. Hohenstein, F. Philipp, O. Brandt, G. E. Crook, and K. Ploog, Ultramicroscopy 49, 273 (1993).
14. P. H. Jouneau, A. Tardot, G. Feuillet, H. Mariette, and J. Cibert, J. Appl. Phys. 75, 7310 (1994).
15. P. Bayle-Guillemaud, Microsc. Microanal. Microstruct. 8, 125 (1997).
16. A. Ourmazd, F. H. Baumann, M. Bode, and Y. Kim, Ultramicroscopy 34, 237 (1990).
17. A. F. deJong and D. V. Dyck, Ultramicroscopy 33, 269 (1990).
18. D. Stenkamp and W. Jäger, Ultramicroscopy 50, 321 (1993).
19. C. Kisielowski, P. Schwander, F. H. Baumann, M. Seibt, Y. Kim, and A. Ourmazd, Ultramicroscopy 58, 131 (1995).
20. C. Barreteau and F. Ducastelle, Phys. Rev. Lett. 75, 284 (1995).
21. P. Stadelmann, Ultramicroscopy 21, 131 (1987).
22. J. C. H. Spence, Experimental High-Resolution Electron Microscopy (Ox-ford University Press, Oxford, 1988).
23. Landolt-Börstein, Numerical Data and Functional Relationship in Science and Technology, Semiconductors Vol. 17b (Springer, Berlin, 1982).
24. P. Maheswaranathan, R. J. Sladek, and U. Debska, Phys. Rev. B 31, 5212 (1985).
25. E. Janik, E. Dynowska, J. Bak-Misiuk, M. Leszcynski, W. Szuszkiewicz, T. Wojtowicz, G. Karczewski, A. K. Zakrzewski, and J. Kossut, Thin Solid Films 267, 74 (1995).
26. J. Eymery, J. M. Hartmann, and G. T. Baumbach, J. Cryst. Growth 184-185, 109 (1998).
27. L. Liszkay, C. Corbel, L. Baroux, P. Hautojarvi, M. Bayham, A. W. Brinkman, and S. Tatarenko, Appl. Phys. Lett. 64, 1380 (1994).
28. A. Barcz, G. Karczewski, T. Wojtowicz, and J. Kossut, J. Cryst. Growth 159, 980 (1996).
29. J. M. Moison, C. Guille, F. Houzay, F. Barthe, and M. V. Rompay, Phys. Rev. B 40, 6149 (1989).
30. S. Kuroda, Y. Terai, K. Takita, T. Okuno, and Y. Masumoto, J. Cryst. Growth 184-185, 274 (1998).
31. J. M. Hartmann, M. Charleux, J. L. Rouvière, and H. Mariette, Appl. Phys. Lett. 70, 1113 (1997).