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Volumn 72, Issue 4, 1994, Pages 566-569
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Columnar-defect-induced resistivity minima and Bose glass scaling of linear dissipation in Tl2Ba2CaCu2O8 epitaxial films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000358542
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.72.566 Document Type: Article |
Times cited : (99)
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References (35)
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