Surface-profile measurement by means of a polarization Sagnac interferometer with parallel optical feedback

Optics Letters

Volumn 24, Issue 5, 1999, Pages 297-299

  Shirai, T ^a,b,c   Barnes, T H ^b   Haskel, T G ^a  

^a CALLAGHAN INNOVATION   (New Zealand)

^b UNIVERSITY OF AUCKLAND   (New Zealand)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000357018     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.000297     Document Type: Article

References (8)

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3. A. D. Fisher and C. Warde, Opt. Lett. 8, 353 (1983).
4. T. H. Barnes, T. Eiju, S. Kokaji, K. Matsuda, and N. Yoshida, Optik 96, 107 (1994).
5. T. H. Barnes, T. Eiju, and K. Matsuda, Optik 101, 17 (1995).
6. T. Yoshino, M. Nara, S. Mnatzakanian, B. S. Lee, and T. C. Strand, Appl. Opt. 26, 892 (1987).
7. T. Suzuki, O. Sasaki, and T. Murayama, Appl. Opt. 28, 4407 (1989).
8. A. R. D. Somervell, "Feedback interferometry for surface profile measurement," M.S. thesis (University of Auckland, Auckland, New Zealand, 1996).