Study of buried interfaces by soft x-ray fluorescence spectroscopy excited by synchrotron radiation

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3, 1996, Pages 859-866

  Ederer, D L ^a   Carlisle, J A ^b   Jimenez, J ^a,f   Jia, J J ^c   Osborn, K ^c   Callcott, T A ^c   Perera, R C C ^d   Underwood, J H ^d   Terminello, L J ^b   Asfaw, A ^b   Himpsel, F J ^e,g  

^a TULANE UNIVERSITY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF TENNESSEE   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e IBM T J WATSON RESEARCH CENTER   (United States)

^f INSTITUTO DE CIENCIAS NUCLEARES   (Mexico)

^g University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000352791     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580404     Document Type: Article

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