-
1
-
-
0001635093
-
-
Allen, F. H., Bellard, S., Brice, M. D., Cartwright, B. A., Doubleday, A., Higgs, H., Hummelink, T., Hummelink-Peters, B. G., Kennard, O., Motherwell, W. D. S., Rodgers, J. R. & Watson, D. G. (1979). Acta Cryst. B35, 2331-2339.
-
(1979)
Acta Cryst.
, vol.B35
, pp. 2331-2339
-
-
Allen, F.H.1
Bellard, S.2
Brice, M.D.3
Cartwright, B.A.4
Doubleday, A.5
Higgs, H.6
Hummelink, T.7
Hummelink-Peters, B.G.8
Kennard, O.9
Motherwell, W.D.S.10
Rodgers, J.R.11
Watson, D.G.12
-
2
-
-
0000871916
-
-
Buschmann, J., Muller, E. & Luger, P. (1986). Acta Cryst. C42, 873-876.
-
(1986)
Acta Cryst.
, vol.C42
, pp. 873-876
-
-
Buschmann, J.1
Muller, E.2
Luger, P.3
-
3
-
-
3242843295
-
-
German Patent DE 4214281 A1
-
Denk, M. K. & Herrmann, W. A. (1993). German Patent DE 4214281 A1.
-
(1993)
-
-
Denk, M.K.1
Herrmann, W.A.2
-
4
-
-
34250088177
-
-
Gar, T. K., Viktorov, N. A., Gurkova, S. N., Gusev, A. I. & Alexeev, N. V. (1987). Zh. Strukt. Khim. 28, 143-145.
-
(1987)
Zh. Strukt. Khim.
, vol.28
, pp. 143-145
-
-
Gar, T.K.1
Viktorov, N.A.2
Gurkova, S.N.3
Gusev, A.I.4
Alexeev, N.V.5
-
7
-
-
0001324904
-
-
Jutzi, P., Schmidt, H., Neumann, B. & Stammler, H.-G. (1996). Organometallics, 15, 741-746.
-
(1996)
Organometallics
, vol.15
, pp. 741-746
-
-
Jutzi, P.1
Schmidt, H.2
Neumann, B.3
Stammler, H.-G.4
-
8
-
-
34250455715
-
-
Kulishov, V. I., Bokii, N. G., Struchkov, Yu. T., Nefedov, O. M., Kolesnikov, S. P. & Perl'mutter, B. L. (1970). Zh. Strukt. Khim. 11, 61-64.
-
(1970)
Zh. Strukt. Khim.
, vol.11
, pp. 61-64
-
-
Kulishov, V.I.1
Bokii, N.G.2
Struchkov, Yu.T.3
Nefedov, O.M.4
Kolesnikov, S.P.5
Perl'mutter, B.L.6
-
12
-
-
84873413072
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1995). SHELXTL/PC User's Manual. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1995)
SHELXTL/PC User's Manual. Version 5.0
-
-
Sheldrick, G.M.1
-
13
-
-
3242873269
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1994). XSCANS. Technical Reference Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1994)
XSCANS. Technical Reference Manual. Version 2.1
-
-
|