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Volumn 70, Issue 26, 1997, Pages 3552-3554
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New ripple patterns observed in excimer-laser irradiated SiO2/polycrystalline silicon/SiO2 structures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000344047
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.119230 Document Type: Article |
Times cited : (27)
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References (6)
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