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Volumn 367, Issue 1-2, 2000, Pages 290-294

MBE growth of planar microcavities with distributed Bragg reflectors

Author keywords

Molecular beam technology growth of Bragg reflectors; Planar microcavities; Vertical cavity surface emitting lasers

Indexed keywords


EID: 0000337726     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00690-8     Document Type: Article
Times cited : (10)

References (8)
  • 3
    • 85049145188 scopus 로고    scopus 로고
    • VCSELs in 98: What we have and what we can expect
    • K.D. Choquette, R.A. Morgan (Eds.), Vertical Cavity Surface Emitting Lasers II
    • L.A. Coldren, E.R. Hegblom, Y.A. Akulova, J. Ko, E.M. Strzelecka, S.Y. Hu, VCSELs in 98: What we have and what we can expect, in: K.D. Choquette, R.A. Morgan (Eds.), Vertical Cavity Surface Emitting Lasers II, Proceedings of SPIE, Vol. 3286, 1998, pp. 2-16.
    • (1998) Proceedings of SPIE , vol.3286 , pp. 2-16
    • Coldren, L.A.1    Hegblom, E.R.2    Akulova, Y.A.3    Ko, J.4    Strzelecka, E.M.5    Hu, S.Y.6
  • 5
    • 33645162647 scopus 로고
    • PhD thesis, University of California, Santa Barbara
    • R.S. Geels. PhD thesis, University of California, Santa Barbara, 1991.
    • (1991)
    • Geels, R.S.1
  • 8
    • 0037858024 scopus 로고
    • J. Katcki, J. Ratajczak, A. Malag, M. Piskorski, in: A.G. Cullis, A. Staton-Bevan (Eds.), IOP, Bristol
    • J. Katcki, J. Ratajczak, A. Malag, M. Piskorski, in: A.G. Cullis, A. Staton-Bevan (Eds.), Microscopy of Semiconducting Materials, IOP, Bristol, 1995, p. 273.
    • (1995) Microscopy of Semiconducting Materials , pp. 273


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.