X-ray photoelectron spectroscopy imaging of laser ablated poly(ether imide)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 105, Issue 2-3, 1999, Pages 113-117

  Schnyder, B ^a   Wambach, J ^a   Kunz, Th ^a   Hahn, Ch ^a   Kotz R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Laser ablation; Poly(ether imide); X ray photoelectron spectroscopy (XPS); XPS imaging

Indexed keywords

EID: 0000325303     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00060-2     Document Type: Article

References (6)

1. R. Srinivasan, V. Mayne-Banton, Appl. Phys. Lett. 40 (1982) 578.
2. Y. Kawamura, K. Toyoda, S. Namba, Appl. Phys. Lett. 40 (1982) 374.
3. N.M. Forsyth, P. Coxon, Surf. Interface Anal. 21 (1994) 430.
4. J.H. Scofield, J. Electron. Spectrosc. Relat. Phenom. 8 (1976) 129.
5. T. Kunz, Ph.D. thesis, ETH Zürich, 1997.
6. G. Beamson, D. Briggs, High Resolution XPS of Organic Polymers, John Wiley and Sons, 1992.