A microcontroller-based scheme for measurement of L and C

Measurement Science and Technology

Volumn 6, Issue 5, 1995, Pages 576-581

  Atmanand, M A ^a   Kumar, V J ^a   Murti, V G K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000318352     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/6/5/019     Document Type: Article

References (7)