-
1
-
-
0027567665
-
-
and references therein for a recent review
-
See A. D. Yoffe, Adv. Phys. 42, 173 (1993) and references therein for a recent review; also see a recent issue of Science, 271 (16 February, 1996) which devotes a section for several articles on nanoclusters.
-
(1993)
Adv. Phys.
, vol.42
, pp. 173
-
-
Yoffe, A.D.1
-
2
-
-
0027567665
-
-
16 February, which devotes a section for several articles on nanoclusters
-
See A. D. Yoffe, Adv. Phys. 42, 173 (1993) and references therein for a recent review; also see a recent issue of Science, 271 (16 February, 1996) which devotes a section for several articles on nanoclusters.
-
(1996)
Science
, vol.271
-
-
-
4
-
-
12944259469
-
-
R. Coehoorn, C. Haas, J. Dijkstra, C. J. F. Flipse, R. A. deGroot, and A. Wold, Phys. Rev. B 35, 6195 (1987), 35, 6203 (1987).
-
(1987)
Phys. Rev. B
, vol.35
, pp. 6195
-
-
Coehoorn, R.1
Haas, C.2
Dijkstra, J.3
Flipse, C.J.F.4
DeGroot, R.A.5
Wold, A.6
-
5
-
-
5544277407
-
-
R. Coehoorn, C. Haas, J. Dijkstra, C. J. F. Flipse, R. A. deGroot, and A. Wold, Phys. Rev. B 35, 6195 (1987), 35, 6203 (1987).
-
(1987)
Phys. Rev. B
, vol.35
, pp. 6203
-
-
-
6
-
-
0003686351
-
-
of Materials with Layered Structures, edited by P. A. Lee Reidel, Boston, Chap. 1
-
B. L. Evans, in Optical and Electrical Properties (of Materials with Layered Structures), edited by P. A. Lee (Reidel, Boston, 1976), Chap. 1, p. 1.
-
(1976)
Optical and Electrical Properties
, pp. 1
-
-
Evans, B.L.1
-
8
-
-
85033166337
-
-
DOE patent No. 5,147,841, (15 Sept. 1992)
-
J. P. Wilcoxon, DOE patent No. 5,147,841, (15 Sept. 1992).
-
-
-
Wilcoxon, J.P.1
-
13
-
-
0016542580
-
-
A. M. Goldberg, A. R. Beal, F. A. Levy, and E. A. Davis, Philos. Mag. 32, 367 (1975).
-
(1975)
Philos. Mag.
, vol.32
, pp. 367
-
-
Goldberg, A.M.1
Beal, A.R.2
Levy, F.A.3
Davis, E.A.4
-
14
-
-
85033164387
-
-
note
-
2 nanoclusters in solution. We use dynamic light scattering (DLS) to obtain this time. The calculated equivalent sphere size is typically slightly larger than found by TEM, [e.g., we find R (DLS)=3.2 nm for clusters which measure R = 2.8 nm by TEM] which argues that the thickness is roughly comparable to the cross-sectional dimension for the smaller clusters. For the larger R = 4.5 nm clusters the equivalent sphere size is actually slightly smaller [e.g., R (DLS) ∼4.0 nm] than the TEM cross-sectional area, which argues that their thickness is smaller than their cross-sectional TEM size. It is important to realize that for very small clusters with R<3 nm there is at least a 10% measurement uncertainty in determining R, so this is the largest source of uncertainty when comparing to theory.
-
-
-
-
15
-
-
0000884529
-
-
F. Parsapour, D. F. Kelley, S. Craft, and J. P. Wilcoxon, J. Chem. Phys. 104, 1 (1996).
-
(1996)
J. Chem. Phys.
, vol.104
, pp. 1
-
-
Parsapour, F.1
Kelley, D.F.2
Craft, S.3
Wilcoxon, J.P.4
|