Density-matrix approach to nonequilibrium free-carrier screening in semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 20, 1997, Pages 13177-13189

  Hohenester, U ^a   Potz W ^b  

^a UNIVERSITY OF GRAZ   (Austria)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000310417     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.13177     Document Type: Article

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