Effect of substrate and antiferromagnetic film's thickness on exchange-bias field (invited)

Journal of Applied Physics

Volumn 73, Issue 10, 1993, Pages 6218-6222

  Allegranza, Oletta ^a   Chen, Mao Min ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000309905     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.352703     Document Type: Article

References (0)