Inclusion characterization in a scattering slab with time-resolved transmittance measurements: Perturbation analysis

Applied Optics

Volumn 39, Issue 16, 2000, Pages 2840-2852

  Morin, Michel ^a   Verreault, Sonia ^a   Mailloux, Alain ^a   Fréchette, Julie ^a   Chatigny, Stéphane ^a   Painchaud, Yves ^a   Beaudry, Pierre ^b  

^a INO   (Canada)

^b ART Advanced Research Technologies Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; LIGHT PROPAGATION; OPTICAL SYSTEMS; PERTURBATION TECHNIQUES;

TRANSMITTANCE MEASUREMENTS;

LIGHT SCATTERING;

EID: 0000304346     PISSN: 00036935     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.39.002840     Document Type: Article

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