메뉴 건너뛰기




Volumn 17, Issue 4, 1999, Pages 1904-1910

Cobalt sputtering target and sputter deposition of Co thin films for cobalt suicide metallization

Author keywords

[No Author keywords available]

Indexed keywords

BEFORE AND AFTER; CO FILMS; CO THIN FILMS; COBALT SALICIDE; DC MAGNETIC FIELD; FORMATION TEMPERATURE; FOUR-POINT PROBE; IV CHARACTERISTICS; LOW RESISTIVITY; MAGNETIC FLUX INTENSITY; METALLIZATIONS; SELF-ALIGNED; SPUTTER PROCESS; SPUTTERING POWER; SPUTTERING PROCESS; SPUTTERING TARGET; ULTRALARGE SCALE INTEGRATION;

EID: 0000297387     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581702     Document Type: Conference Paper
Times cited : (33)

References (23)
  • 4
    • 0038884544 scopus 로고
    • 4-6 October 1994, Austin, TX Materials Research Society, Pittsburgh, PA
    • K. Maex, in Advanced Metallization for ULSI Applications in 1994, 4-6 October 1994, Austin, TX (Materials Research Society, Pittsburgh, PA, 1995), pp. 405-414.
    • (1995) Advanced Metallization for ULSI Applications in 1994 , pp. 405-414
    • Maex, K.1
  • 15
    • 78649789351 scopus 로고    scopus 로고
    • ASTM, West Conshohocken, PA
    • ASTM Designation F 1761-96, ASTM, West Conshohocken, PA, 1996.
    • (1996) ASTM Designation F 1761-96
  • 19
    • 78649784832 scopus 로고
    • edited by J. L. Vossen and W. Kern Academic, New York
    • R. K. Waits, in Thin Film Process, edited by J. L. Vossen and W. Kern (Academic, New York, 1978), p. 148.
    • (1978) Thin Film Process , pp. 148
    • Waits, R.K.1
  • 22
    • 84940848403 scopus 로고
    • edited by J. L. Vossen and W. Kern Academic, Boston
    • R. Parsons, in Thin Film Processes II, edited by J. L. Vossen and W. Kern (Academic, Boston, 1991), p. 177.
    • (1991) Thin Film Processes II , pp. 177
    • Parsons, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.