Defect-induced tetragonalization of the orthorhombic TiSi2 C49 phase: X-ray diffraction and first principles calculations

Applied Physics Letters

Volumn 78, Issue 6, 2001, Pages 739-741

  La Via, F ^a   Grimaldi, M G ^b   Migas, D B ^c   Miglio, Leo ^c  

^a CNR IMETEM   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000290173     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1345829     Document Type: Article

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