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Volumn 82, Issue 8, 1997, Pages 3808-3814
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Growth kinetics of amorphous interlayers and formation of crystalline suicide phases in ultrahigh vacuum deposited polycrystalline Er and Tb thin films on (001)Si
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000282963
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.365743 Document Type: Article |
Times cited : (32)
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References (25)
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