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Volumn 82, Issue 8, 1997, Pages 3808-3814

Growth kinetics of amorphous interlayers and formation of crystalline suicide phases in ultrahigh vacuum deposited polycrystalline Er and Tb thin films on (001)Si

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EID: 0000282963     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365743     Document Type: Article
Times cited : (32)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.