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Volumn 44, Issue 3 PART 1, 1997, Pages 874-880

An "Edge-On" silicon strip detector for X-ray imaging

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EID: 0000277601     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603769     Document Type: Article
Times cited : (21)

References (15)
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  • 8
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  • 10
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    • Operation and radiation resistance of a FOXFET biasing structure for silicon strip detectors
    • M. Laakso et al., "Operation and radiation resistance of a FOXFET biasing structure for silicon strip detectors", Nucl. Instr. and Meth. in Phys. Res. A, vol. 326, pp. 214-221, 1993.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.