Exploring reciprocal space of a quasicrystal by means of an imaging plate

Journal of Applied Crystallography

Volumn 32, Issue 3, 1999, Pages 442-451

  Kopecky, Milos ^a,c   Colella, Roberto ^b  

^a SINCROTRONE TRIESTE   (Italy)

^b PURDUE UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000276397     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898017725     Document Type: Article

References (10)

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3. (Tables of observed intensities and calculated structure factors were kindly provided in the form of a private communication by M. de Boissieu and M. Boudard.)
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