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Journal of Applied Physics

Volumn 71, Issue 9, 1992, Pages 4264-4268

Vacancy supersaturation model for electromigration failure under dc and pulsed dc stress

(1) Clement, J J a

a HEWLETT PACKARD COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000268479 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.350807 Document Type: Article

Times cited : (37)

References (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.