Surface sensitive X-ray scattering

Annual Review of Materials Science

Volumn 20, Issue 1, 1990, Pages 365-390

  Fuoss, P H ^a   Brennan, S ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Surface structure determination; Synchrotron radiation; X ray diffraction

Indexed keywords

EID: 0000267915     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.ms.20.080190.002053     Document Type: Article

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