Measuring electron affinities with the photodetachment microscope

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 59, Issue 5, 1999, Pages 3809-3815

  Valli, Christophe ^a   Blondel, Christophe ^a   Delsart, Christian ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000265301     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.59.3809     Document Type: Article

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