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Volumn 112, Issue 13, 2000, Pages 5558-5565
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Reaction field treatment of charge penetration
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000262725
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.481133 Document Type: Article |
Times cited : (254)
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References (37)
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