Characterization of partial monolayers on glass using friction force microscopy

Langmuir

Volumn 12, Issue 25, 1996, Pages 6053-6058

  Peach, Sarah ^a   Polak, Robert D ^a   Franck, Carl ^a  

^a Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000255145     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la960328z     Document Type: Article

References (32)

1. Maoz, R.; Sagiv, J. J. Colloid Interface Sci. 1984, 100. 465.
2. Bourdieu, L.: Maaloum. M.; Silberzan, P.; Ausserre, D.; Coulon, G.; Chatenay, D. Ann. Chim. (Paris) 1992, 17, 229.
3. Flinn, D. H.; Guzonas, D. A.; Yoon, R.-H. Colloids Surf., A 1994, 87, 163.
4. Wasserman, S. R; Whitesides, G. M.; Tidswell, I. M.; Ocko, B. M.; Pershan, P. S.; Axe, J. D. J. Am. Chem. Soc. 1989, 111, 5852.
5. Tidswell, I. M.; Ocko. B. M.; Pershan, P. S.; Wasserman, S. R; Whitesides, G. M.; Axe, J. D. Phys. Rev: B 1990, 41, 1111.
6. Tidswell, I. M.; Rabedeau, T. A.; Pershan, P. S.; Kosowsky, S. D.; Folkers, J. P.; Whitesides, G. M. J. Chem. Phys. 1991, 95, 2854.
7. Parikh, A. N.; Allara, D. L.; Azouz, I. B.; Rondelez, F. J. Phys. Chem. 1994, 98, 7577.
8. Iler, R. K. The Chemistry of Silica; Wiley-Interscience: New York, 1979.
9. Allara, D. L.; Parikh, A. N.; Judge, E. J. Chem. Phys. 1994,100, 1761.
10. Desai, N. S.; Peach, S.; Franck, C. Phys. Rev. E. 1995, 52 ,4129.
11. Zasadzinski, J. A.; Viswanathan, R.; Schwartz, D. K.; Garnaes, J.; Madsen, L.; Chiruvolu, S.; Woodward, J. T.; Longo, M. L. Colloids Surf., A 1994, 93, 305.
12. See, for example: Hues, S. M.; Colton, R. J.; Meyer, E.; Güntherodt, H.-J. MRS Bull. 1993, January, 41 and references therein.
13. Cléchet, P.; Martelet, C.; Belin, M.; Zarrad, H.; Jaffrezic-Renault, N.; Fayeulle, S. Sens. Actuators, A 1994, 44, 77.
14. Overney, R.M.; Meyer, E.; Frommer, J.; Brodbeck, D.; Lüthi, R.; Howald, L.; Güntherodt, H.-J.; Fujihira, M.; Takano, H.; Gotoh, Y. Nature 1992, 359, 133.
15. Fisher Scientific, cat, no. 12-546 18CIR-2.
16. The cover slips were rinsed and sonicated at 50 °C in the following sequence of solvents (total sonication times and number of solvent changes given in parentheses): dilute solution of Pex laboratory glass cleaner in distilled water (45 min, 3), distilled water (45 min, 3), acetone (30 min, 1), methanol (60 min, 3), 0.01 M solution of etylenediaminetetraacetic acid (60 min, 2), 1:3 solution of nitric acid in distilled water (30 min, 1), boiling distilled water (30 min, 2). Pex obtained from Peck's Products Co., St. Louis.
17. See, for example: Ulman, A. An Introduction to Ultrathin Organic Films; Academic Pres: New York, 1991; and references therein.
18. o. See, for example, refs 3 and 4 and: Wasserman, S.; Tao, Y.-T.; Whitesides, G. M. Langmuir 1989, 5, 1074. Olson, D. A.; Osteraas, A. J. J. Phys. Chem. 1964, 68, 2730; measured zero contact angles on glass substrates.
19. o. See, for example, refs 3 and 4 and: Wasserman, S.; Tao, Y.-T.; Whitesides, G. M. Langmuir 1989, 5, 1074. Olson, D. A.; Osteraas, A. J. J. Phys. Chem. 1964, 68, 2730; measured zero contact angles on glass substrates.
20. Tidswell, I. M.; Rabedeau, T. A.; Pershan, P. S.; Folkers, J. P.; Baker, M. V.; Whitesides, G. M. Phys. Rev. B 1991, 44, 10869.
21. Cassie, A. B. D. Discuss. Faraday Soc. 1948, 3, 11.
22. Israelachvili, J. N.; Gee, M. L. Langmuir 1989, 5, 288.
23. Only advancing contact angles were used in our quantitative analysis.
24. Wasserman, S.; Tao, Y.-T.; Whitesides, G. M. Langmuir 1989, 5, 1074.
25. Johnson, R. E.; Dettre, R. H. Contact Angle, Wettability, and Adhesion; Advances in Chemistry Series; American Chemical Society Applied Publications: Washington, DC, 1964; Vol. 43.
26. Neumann, A. W.; Good, R. J. J. Colloid Interface Sci. 1972, 38, 341.
27. Schwartz, L. W.; Garoff, S. Langmuir 1985, 1, 219.
28. Garoff, S. Private communication.
29. Grafström, S.; Neitzert, M.; Hagen, T.; Ackermann, J.; Neumann, R.; Probst, O.; Wörtge, M. Nanotechnology 1993, 4, 143.
30. As described in Digital Instruments Nanoscope III Multimode SPM Instruction Manual, pp 61-62.
31. Putman, C. A. J.; Igarashi, M.; Kaneko, R. Appl. Phys. Lett. 1995, 66, 3221.
32. Zhong, Q.; Inniss, D.; Kjoller, K.; Elings, V. B. Surf. Sci. 1993, 290, L688.