Thermal stability of Mo/C/Si/C multilayer soft X-ray mirrors

Journal of Electron Spectroscopy and Related Phenomena

Volumn 80, Issue , 1996, Pages 381-384

  Takenaka, Hisataka ^a   Kawamura, Tomoaki ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000254510     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)02997-0     Document Type: Article

References (13)

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