Hall factor in strained p-type dope alloy

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 16, 1996, Pages 11317-11321

  Fu, Y ^a   Joelsson, K ^b  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000247350     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.11317     Document Type: Article

References (17)

1. G. L. Patton, J. H. Comfort, B. S. Meyerson, E. F. Crabbé, G. J. Scilla, E. De Fre'sart, J. M. Stork, J. Y.-C. Sun, D. L. Harame and J. N. Burghartz, IEEE Electron Device Lett. 11, 171 (1990).
2. E. Crabbé, B. Meyerson, D. Harame, J. Stork, A. Megdanis, J. Cotte, J. Chu, M. Gilbert, C. Stains, J. Comfort, G. Patton and S. Subbanna, IEEE Trans. Electron Devices, 40, 2100 (1993).
3. Y. Fu, K. Grahn and M. Willander, IEEE Trans. Electron Devices 41, 26 (1994).
4. T. K. Carns, S. K. Chun, M. O. Tanner, K. L. Wang, T. I. Kamins, J. E. Turner, D. Y. C. Lie, M.-A. Nicolet and R. G. Wilson, IEEE Trans. Electron Devices 41, 1273 (1994).
5. G. L. Bir and G. E. Pikus, Fiz. Tverd. Tela 1, 1642 (1959) [Sov. Phys. Solid State 2, 2039 (1960)].
6. P. Lawaetz, Phys. Rev. 174, 867 (1968).
7. S. Selberherr, W. Hänsch, M. Seavey and J. Slotboom, Solid State Electron. 33, 1425 (1990).
8. F. Szumoliwicz, Phys. Rev. B28, 5943 (1983).
9. K. Takeda, A. Taguchi and M. Sakat, J. Phys. C 16, 2237 (1983).
10. L. Makovski and M. Glicksman, J. Phys. Chem. Solids 34, 487 (1973).
11. H. Brooks and L. Herring, Phys. Rev. 83, 879 (1951).
12. S. M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
13. W.-X. Ni, J. O. Ekberg, K. B. Joelsson, H. H. Radamsson, A. Henry, G.-D. Shen and G. V. Hansson, J. Cryst. Growth 157, 285 (1995).
14. Y. V. Mamontov and M. Willander, IEICE Trans. Electron E77-C, 287 (1994).
15. Y. V. Mamontov and M. Willander, Solid State Electron 38, 599 (1995).
16. K. B. Wolfstirn, J. Phys. Chem. Solids 16, 279 (1960).
17. Y. Fu, S. Jain, M. Willander and J. J. Loferski, J. Appl. Phys. 74, 402 (1993).