SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Solid State Electronics

Volumn 15, Issue 3, 1972, Pages 293-302

Low level currents in insulated gate field effect transistors

(1) Barron, M B a

a GE GLOBAL RESEARCH (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000247245 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1101(72)90084-6 Document Type: Article

Times cited : (111)

References (15)

1
- 0009703767
- (1964) Solid-St. Electron. , vol.7 , pp. 423
- Ihantola¹ Moll²

2
- 0000175457
- The silicon insulated-gate field-effect transistor
- (1963) Proceedings of the IEEE , pp. 1190
- Hofstein¹ Heiman²

3
- 84918044850
- Characteristics of the metal-Oxide-semiconductor transistors
- (1964) IEEE Transactions on Electron Devices , vol.11 ED , pp. 324
- Sah¹

4
- 2342589254
- McGraw-Hill, New York
- (1967) Characteristics and Operation of MOS Field Effect Devices
- Richman¹

5
- 84918237065
- J.S. Brugler, private communication.

6
- 84918189160
- Electron and hole mobilities in inversion layers on thermally oxidized silicon surfaces
- (1965) IEEE Transactions on Electron Devices , vol.12 ED , pp. 5
- Leistiko¹ Grove² Sah³

7
- 0142200224
- McGraw-Hill, New York
- (1967) MOSFET in Circuit Design
- Crawford¹

8
- 84937647369
- (1952) Proc. IEEE , vol.40 , pp. 1365
- Shockley¹

9
- 49949134400
- (1966) Solid-St. Electron. , vol.9 , pp. 927
- Pao¹ Sah²

10
- 84916343724
- Computer Aided Analysis of Insulated Gate Field Effect Transistors
- Stanford Electronics Laboratories, Stanford, California
- (1969) Report No. 5501-1 , pp. 123-128
- Barron¹

11
- 0003879668
- John Wiley, New York
- (1967) Physics and Technology of Semiconductor Devices
- Grove¹

12
- 36049059178
- (1968) Phys. Rev. , vol.169 , pp. 619
- Fang¹ Fowler²

13
- 0000339559
- (1965) Solid-St. Electron. , vol.8 , pp. 145
- Grove¹ Deal² Snow³ Sah⁴

14
- 0008571870
- Si-SiO[sub 2] Fast Interface State Measurements
- (1968) Journal of The Electrochemical Society , vol.115 , pp. 760
- Brown¹ Gray²

15
- 0003855018
- Blaisdell, Waltham, Mass
- (1967) Numerical Integration
- Davis¹ Rabinowitz²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.