Calibration plans for the multi-angle imaging spectroradiometer (MISR)

Metrologia

Volumn 30, Issue 4, 1993, Pages 213-221

  Bruegge, C J ^a   Duval, V G ^a   Chrien, N L ^a   Diner, D J ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000231034     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/30/4/002     Document Type: Article

References (7)

1. Sensor systems for the early earth observing system platforms
2. Radiometry and Photometry: Units and Conversion Factors
3. Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material
4. Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors