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Volumn 40, Issue 14, 1989, Pages 9636-9643
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Structural investigation of a-Si and a-Si:H using x-ray-absorption spectroscopy at the Si K edge
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000229909
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.40.9636 Document Type: Article |
Times cited : (65)
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References (32)
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