메뉴 건너뛰기




Volumn 40, Issue 14, 1989, Pages 9636-9643

Structural investigation of a-Si and a-Si:H using x-ray-absorption spectroscopy at the Si K edge

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000229909     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.40.9636     Document Type: Article
Times cited : (65)

References (32)
  • 31
    • 84931516784 scopus 로고    scopus 로고
    • In a previous paper (Ref. 22) we have claimed that the second-shell EXAFS accounts for the phase of the residual signal, but that time we were looking at a rather short k range (up to 4.5 A ang sup -1_).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.