Studies of epitaxial Fe0.5Pd0.5 thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy

Journal of Applied Physics

Volumn 84, Issue 4, 1998, Pages 2316-2323

  Gehanno, V ^a   Revenant Brizard, C ^a   Marty, A ^a   Gilles, B ^b  

^a CEA GRENOBLE   (France)

^b UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000229257     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368298     Document Type: Article

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