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Volumn 69, Issue 25, 1996, Pages 3875-3877

Enhanced nitrogen incorporation and improved breakdown endurance in nitrided gate oxides prepared by anodic oxidation followed by rapid thermal nitridation in N2O

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EID: 0000228733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117134     Document Type: Article
Times cited : (11)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.