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Volumn 69, Issue 25, 1996, Pages 3875-3877
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Enhanced nitrogen incorporation and improved breakdown endurance in nitrided gate oxides prepared by anodic oxidation followed by rapid thermal nitridation in N2O
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000228733
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117134 Document Type: Article |
Times cited : (11)
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References (11)
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