Reversible structure change of one-atomic layer GeO2 on SiO2 surface under the interaction with Rh particles by in situ XAFS studies

Catalysis Today

Volumn 39, Issue 4, 1998, Pages 343-350

  Okumura, Kazu ^a   Asakura, Kiyotaka ^a   Iwasawa, Yasuhiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

GeO2 layer on SiO2; Rh particles; Structural change; XAFS

Indexed keywords

EID: 0000227313     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5861(97)00126-0     Document Type: Article

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