Chemical force microscopy: Exploiting chemically-modified tips to quantify adhesion, friction, and functional group distributions in molecular assemblies

Journal of the American Chemical Society

Volumn 117, Issue 30, 1995, Pages 7943-7949

  Noy, Aleksandr ^a   Frisbie, C Daniel ^a   Rozsnyai, Lawrence F ^b   Wrighton, Mark S ^b   Lieber, Charles M ^a  

^a HARVARD UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000226927     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja00135a012     Document Type: Article

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